Apparatus and method to test workpieces for size, relative posit

Details Apparatus and method to test workpieces for size, relative posit Apparatus and method to test workpieces for size, relative posit

1978-04-17

1980-08-12

Corbin, John K.

Optics: measuring and testing

By polarized light examination

With light attenuation

250224, 356387, G01B 1100, G01B 1104

Patent

active

042170532

ABSTRACT:
A workpiece is passed through a beam of either continuous or pulsed light which is interrupted thereby. The light impinges on a phototransducer such as a phototransistor, which is connected to an evaluation circuit. The evaluation circuit evaluates instantaneous light values with respect to movement of the workpieces in the beam, that is, evaluates variations derived from the transducer which preferably are decoded with respect to threshold levels and the time between sequential level exceeding, or passing, the thresholds is sensed, for example by a counter, to provide an output representative of the occurrence of changes in the light values indicative, for example, of discontinuities in the workpiece.

REFERENCES:
patent: 2812685 (1957-11-01), Vossberg
patent: 3782834 (1974-01-01), Fujimori et al.
patent: 3803474 (1974-04-01), Clarke
patent: 3905705 (1975-09-01), Petrohilos
patent: 4007992 (1977-02-01), Petrohilos et al.
patent: 4063820 (1977-12-01), Borgese

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