Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2000-12-08
2003-09-23
Cuneo, Kamand (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S750010, C324S755090
Reexamination Certificate
active
06624643
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates generally to silicon devices and integrated circuits, and in particular but not exclusively, relates to reading output information from a backside of a silicon device.
2. Background Information
Communication from a silicon device or integrated circuit to external components on a motherboard is typically done via use of electrical connections between the silicon and a substrate material. Examples of such electrical connections include wire bonding and controlled collapse chip carrier (C4) connections.
In instances where faster communication from the silicon device to the motherboard is needed, directed chip attachment (DCA) technology has been considered. Unfortunately, DCA technology has serious reliability issues with regards to thermal mismatches and production/inventory control.
With the ever-increasing need for high-speed applications, such as those beyond 2.5 Gbits/second, the above-mentioned electrical connections and DCA connections face severe limitations due to thermal dissipation, skin effect attenuation, jitter and noise issues, etc. Such limitations significantly degrade signal and performance characteristics associated with communication between silicon devices and external components, particularly when reading output information/signals from the silicon devices.
REFERENCES:
patent: 5334540 (1994-08-01), Ishii
patent: 5493236 (1996-02-01), Ishii et al.
patent: 5698474 (1997-12-01), Hurley
patent: 5783835 (1998-07-01), Hollman et al.
patent: 5930588 (1999-07-01), Paniccia
patent: 5959461 (1999-09-01), Brown et al.
patent: 6020746 (2000-02-01), Livengood
patent: 6144213 (2000-11-01), Johnson
patent: 6159754 (2000-12-01), Li et al.
patent: 6251706 (2001-06-01), Paniccia
patent: 6261870 (2001-07-01), Haehn et al.
patent: 6329212 (2001-12-01), Dobrovolski
patent: 6335629 (2002-01-01), Lee et al.
patent: 6375347 (2002-04-01), Bruce et al.
Dishongh Terrence J.
Dujari Prateek
Lian Bin C.
Searls Damion T.
Blakely , Sokoloff, Taylor & Zafman LLP
Cuneo Kamand
Hollington Jermele
Intel Corporation
LandOfFree
Apparatus and method to read output information from a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method to read output information from a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method to read output information from a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3072805