Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent
1987-08-07
1990-03-27
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Containers or enclosures
356246, 356432, G01N 2100, G01N 2190
Patent
active
049125290
ABSTRACT:
An apparatus to compensate for refraction of radiation passing through a curved wall of an article is provided. The apparatus of a preferred embodiment is particularly advantageous for use in arc tube discharge diagnostics. The apparatus of the preferred embodiment includes means for pre-refracting radiation on a predetermined path by an amount equal and inverse to refraction which occurs when radiation passes through a first wall of the arc tube such that, when the radiation passes through the first wall of the arc tube and into the cavity thereof, the radiation passes through the cavity approximately on the predetermined path; means for releasably holding the article such that the radiation passes through the cavity thereof; and means for post-refracting radiation emerging from a point of the arc tube opposite its point of entry by an amount equal and inverse to refraction which occurs when radiation emerges from the arc tube. In one embodiment the means for pre-refracting radiation includes a first half tube comprising a longitudinally bisected tube obtained from a tube which is approximately identical to the arc tube's cylindrical portion and a first cylindrical lens, the first half tube being mounted with its concave side facing the radiation source and the first cylindrical lens being mounted between the first half tube and the arc tube and the means for post-refracting radiation includes a second half tube comprising a longitudinally bisected tube obtained from a tube which is approximately identical to the arc tube's cylindrical portion and a second cylindrical lens, the second half tube being mounted with its convex side facing the radiation source and the second cylindrical lens being mounted between the arc tube and the second half tube. Methods to compensate for refraction of radiation passing into and out of an arc tube is also provided.
REFERENCES:
patent: 3523738 (1970-08-01), Chisholm
patent: 4680977 (1987-07-01), Conero et al.
Van Den Hoer, "Diagnostic Methods in Lamp Research," Philips Journal Res., 1983, pp. 188-213.
Allen Gary R.
Moskowitz Philip E.
Finnegan Martha Ann
GTE Products Corporation
McGraw Vincent P.
Turner S. A.
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