Apparatus and method to characterize multijunction...

Details Apparatus and method to characterize multijunction... Apparatus and method to characterize multijunction...

2011-05-30

2011-12-06

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C136S249000, C136S255000

Reexamination Certificate

active

08073645

ABSTRACT:
An apparatus to electrically and optically characterize a multijunction solar cell. The apparatus can have as many light sources as there are subcells in the multijunction solar cell. Each light source has an optical spectrum that falls within the bandgap energy of a corresponding subcell. Each light source has a controllable intensity level.

REFERENCES:
patent: 5223043 (1993-06-01), Olson et al.
patent: 6316715 (2001-11-01), King et al.
Adelhelm et al., “Performance and parameter analysis of tandem solar cells using measurements at multiple spectral conditions”, Solar Energy Materials and Solar Cells, 1998, pp. 185-195.
Meusel et al., “Spectral Mismatch Correction and Spectrometric Characterization of Monolithic III-V Multi-junction Solar Cells”, Progress in Photovoltaics: Research and Applications, Jan. 28, 2002, pp. 243-255.
Guter et al., “I-V Characterization of Tunnel Diodes and Multi-junction Solar Cells”, IEEE Transactions on Electron Devices, vol. 53, No. 9, Sep. 2006, pp. 2216-2222.

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