Apparatus and method of X-ray topography at cryogenic temperatur

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250275, 250277CH, G01H 2320

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active

039926249

ABSTRACT:
A method of x-ray topography of crystals at cryogenic temperatures which s not require continuous pumping of the sample chamber during low-temperature operation. The method eliminates the problems of vibrations degrading the high-resolution photographic image recorded and also prevents loss of the sample's angular alignment with the x-ray beam caused by torques produced by a vacuum-coupling mechanism.

REFERENCES:
patent: 3390267 (1968-06-01), Deminet
patent: 3751662 (1973-08-01), Grienauer
patent: 3839635 (1974-10-01), Chan
patent: 3855469 (1974-12-01), Pluchery
patent: 3860815 (1975-01-01), Hall

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