Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2011-03-22
2011-03-22
Raevis, Robert R (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07908909
ABSTRACT:
The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
REFERENCES:
patent: 5157256 (1992-10-01), Aaron
patent: 5266801 (1993-11-01), Elings et al.
patent: RE34489 (1993-12-01), Hansma et al.
patent: 5412980 (1995-05-01), Elings et al.
patent: 5705814 (1998-01-01), Young et al.
patent: 5856650 (1999-01-01), Rise et al.
patent: 6093930 (2000-07-01), Boyette, Jr. et al.
patent: 6748794 (2004-06-01), Ray
patent: 6951129 (2005-10-01), Kwon et al.
patent: 2005/0208554 (2005-09-01), Chan et al.
Feinstein Adam J.
Wilson Matthew R.
Boyle Fredrickson , S.C.
Bruker Nano, Inc.
Raevis Robert R
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