Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate
2008-07-01
2008-07-01
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
C073S15000R, C073S827000, C073S842000, C073S856000
Reexamination Certificate
active
07392708
ABSTRACT:
A method an apparatus for testing shear strain response of a test specimen having a thick adhesive bond line is disclosed. Method and apparatus permit the use of readily available clip-on extensometers. The apparatus and method may include the use of knife edges secured to each of two adherend components on a standard ASTM D 5656 thick adherent test specimen.
REFERENCES:
patent: 4522066 (1985-06-01), Kistler et al.
patent: 4848161 (1989-07-01), van der Kuur
patent: 5119569 (1992-06-01), Meline
patent: 5275057 (1994-01-01), Alexander
patent: 5335547 (1994-08-01), Nakajima et al.
patent: 5361640 (1994-11-01), Carroll et al.
L.E. Crocker and G.D. Dean. Tensile Testing of Adhesive Buss-joint Specimens. “http://midas.npl.co.uk/midas/content/ma09.html” May 2001.
“Evaluation and Adjustments for ASTM D 5656 Standard Test Method for Thick-Adherend Metal Lap-Shear Joints for Determination of the Stress-Strain Behavior of Adhesives in Shear by Tension Loading”, Yang et al., American Chemical Society, 2001, pp. 36-43.
“Shear Stress-Strain Data for Structural Adhesives”, Tomblin et al., U.S. Department of Transportation, Federal Aviation Administration, Final Report, Nov. 2002.
“Characterization of Bondline Thickness Effects in Adhesive Joints”, Tomblin et al., Journal of Composites Technology & Research, 2002, pp. 80-92.
“Model 632.02 Clip-On Gage”, MTS Systems Corporation 2001, 2 pages.
Bohlmann Raymond E.
Hurd Milton D.
Wollschlager Jeff
Kirkland, III Freddie
Lefkowitz Edward
The Boeing Company
Wildman Harrold Allen & Dixon LLP
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