Apparatus and method of inspecting breakdown of conducting wire

Details Apparatus and method of inspecting breakdown of conducting wire Apparatus and method of inspecting breakdown of conducting wire

2008-01-15

2008-01-15

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S528000, C324S457000

Reexamination Certificate

active

11130279

ABSTRACT:
A breakdown inspection apparatus for a wire includes a power supply applying a voltage to the wire and an electric field sensor detecting an electric field generated around the wire by the applied voltage so as for a user to determine according to variation of the electric field if there is an open defect in the wire.

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patent: 2003/0016026 (2003-01-01), Kawaike et al.
patent: 2004/0095144 (2004-05-01), Yamaoka et al.
patent: 2000292473 (2000-10-01), None
patent: 2001-0022424 (2001-03-01), None
patent: 2001-0111969 (2001-12-01), None
patent: WO-2004/076966 (2004-10-01), None

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