Apparatus and method for the parallel and independent...

Details Apparatus and method for the parallel and independent... Apparatus and method for the parallel and independent...

2005-06-07

2005-06-07

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

06903565

ABSTRACT:
An apparatus for the parallel and independent testing of a plurality of semiconductor devices disposed on a wafer, in which the semiconductor devices are in each case connected to a common voltage supply unit through a controllable isolating apparatus, a voltage-regulating unit, and a current-limiting unit, and to a method for operating such an apparatus.

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