Apparatus and method for the inspection of the surface of a...

Details Apparatus and method for the inspection of the surface of a... Apparatus and method for the inspection of the surface of a...

2009-01-16

2011-10-25

Ton, Tri T (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

C356S237200

Reexamination Certificate

active

08045144

ABSTRACT:
An apparatus for inspection of a surface of a component includes a probing device (21) which is coupled to a traversing device (50) and has at least one probe carrier (22, 23), to which at least one inspection mechanism is fitted. In order to enable surface defects in a component (11) to be shown directly and without conversion, the inspection mechanism is an image pick-up unit (26, 27).

REFERENCES:
patent: 7146291 (2006-12-01), Hough
patent: 2002/0080344 (2002-06-01), Tomita et al.
patent: 2002/0089298 (2002-07-01), Hatley et al.
patent: 2004/0021856 (2004-02-01), Nishiyama et al.
patent: 2006/0236769 (2006-10-01), Tenley et al.
patent: 2007/0089545 (2007-04-01), Roney et al.
European Search Report dated Dec. 30, 2010 from the counterpart European application.

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