Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2004-04-19
2009-11-24
Bella, Matthew C (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S100000, C382S103000, C382S141000, C382S151000, C382S110000, C382S112000, C700S122000, C700S124000, C700S125000
Reexamination Certificate
active
07623699
ABSTRACT:
A system for the characterization of webs that permits the identification of anomalous regions on the web to be performed at a first time and place, and permits the localization and marking of actual defects to be performed at a second time and place.
REFERENCES:
patent: 3759620 (1973-09-01), Cushing et al.
patent: 4134684 (1979-01-01), Jette
patent: 4173441 (1979-11-01), Wolf
patent: 4211132 (1980-07-01), Nichols, III et al.
patent: 4330356 (1982-05-01), Grollimund et al.
patent: 4458852 (1984-07-01), Calvert et al.
patent: 4567064 (1986-01-01), Woste
patent: 4629312 (1986-12-01), Pearce et al.
patent: 4700627 (1987-10-01), Hagler
patent: 4746020 (1988-05-01), Schenk
patent: 4752897 (1988-06-01), Zoller et al.
patent: 4776023 (1988-10-01), Hamada et al.
patent: 4828156 (1989-05-01), Whiteley et al.
patent: 4877323 (1989-10-01), Stillwagon
patent: 4905159 (1990-02-01), Loriot
patent: 4927180 (1990-05-01), Trundle et al.
patent: 4951223 (1990-08-01), Wales et al.
patent: 4972326 (1990-11-01), Jung et al.
patent: 4982600 (1991-01-01), Kiso et al.
patent: 5062331 (1991-11-01), Michal et al.
patent: 5068799 (1991-11-01), Jarrett, Jr.
patent: 5301129 (1994-04-01), McKaughan et al.
patent: 5305392 (1994-04-01), Longest, Jr. et al.
patent: 5351202 (1994-09-01), Kurtzberg et al.
patent: 5365596 (1994-11-01), Dante et al.
patent: 5403722 (1995-04-01), Floeder et al.
patent: 5415123 (1995-05-01), Ryder
patent: 5434629 (1995-07-01), Pearson et al.
patent: 5440648 (1995-08-01), Roberts et al.
patent: 5450116 (1995-09-01), Weiselfish et al.
patent: 5544256 (1996-08-01), Brecher et al.
patent: 5696591 (1997-12-01), Bilhorn et al.
patent: 5710420 (1998-01-01), Martin et al.
patent: 5760414 (1998-06-01), Taylor
patent: 5774177 (1998-06-01), Lane
patent: 5873392 (1999-02-01), Meyer et al.
patent: 5949550 (1999-09-01), Arndt et al.
patent: 6014209 (2000-01-01), Bishop
patent: 6031931 (2000-02-01), Chiu et al.
patent: 6092059 (2000-07-01), Straforini et al.
patent: 6100989 (2000-08-01), Leuenberger
patent: 6137967 (2000-10-01), Laussermair et al.
patent: 6252237 (2001-06-01), Ramthun et al.
patent: 6259109 (2001-07-01), Dalmia et al.
patent: 6266436 (2001-07-01), Bett et al.
patent: 6266437 (2001-07-01), Eichel et al.
patent: 6272437 (2001-08-01), Woods et al.
patent: 6295129 (2001-09-01), Bjork
patent: 6314379 (2001-11-01), Hu et al.
patent: 6330350 (2001-12-01), Ahn et al.
patent: 6404910 (2002-06-01), Ungpiyakul et al.
patent: 6407373 (2002-06-01), Dotan
patent: 6452679 (2002-09-01), Workman, Jr.
patent: 6479228 (2002-11-01), Majumdar et al.
patent: 6484306 (2002-11-01), Bokor et al.
patent: 6496596 (2002-12-01), Zika et al.
patent: 6661507 (2003-12-01), Yoda et al.
patent: 6665432 (2003-12-01), Evans et al.
patent: 6750466 (2004-06-01), Guha et al.
patent: 6765224 (2004-07-01), Favreau et al.
patent: 6778694 (2004-08-01), Alexandre
patent: 6798925 (2004-09-01), Wagman
patent: 6804381 (2004-10-01), Pang et al.
patent: 6812997 (2004-11-01), Kaltenbach et al.
patent: 6814514 (2004-11-01), Korngold et al.
patent: 6845278 (2005-01-01), Popp et al.
patent: 6934028 (2005-08-01), Ho et al.
patent: 6950547 (2005-09-01), Floeder et al.
patent: 7117057 (2006-10-01), Kuo et al.
patent: 7120515 (2006-10-01), Floeder et al.
patent: 7187995 (2007-03-01), Floeder et al.
patent: 2002/0019112 (2002-02-01), Farrar
patent: 2002/0020704 (2002-02-01), Zacharias
patent: 2002/0030704 (2002-03-01), Korngold et al.
patent: 2002/0039436 (2002-04-01), Alumot et al.
patent: 2002/0080347 (2002-06-01), Yoda et al.
patent: 2002/0109112 (2002-08-01), Guha et al.
patent: 2002/0110269 (2002-08-01), Floeder et al.
patent: 2002/0176617 (2002-11-01), Simonetti
patent: 2003/0081219 (2003-05-01), Bennett
patent: 2003/0189704 (2003-10-01), Floeder et al.
patent: 2004/0030435 (2004-02-01), Popp et al.
patent: 2004/0039435 (2004-02-01), Hancock et al.
patent: 2004/0058540 (2004-03-01), Matsumoto et al.
patent: 2005/0075801 (2005-04-01), Skeps et al.
patent: 2005/0141760 (2005-06-01), Floeder et al.
patent: 2005/0144094 (2005-06-01), Floeder et al.
patent: 2005/0154485 (2005-07-01), Popp et al.
patent: 2005/0232475 (2005-10-01), Floeder et al.
patent: 2006/0055398 (2006-03-01), Kuroyanagi et al.
patent: 2006/0164645 (2006-07-01), Hietanen et al.
patent: 2009/0028416 (2009-01-01), Floeder et al.
patent: 2009/0028417 (2009-01-01), Floeder et al.
patent: 2009/0030544 (2009-01-01), Floeder et al.
patent: 0 681 183 (1995-11-01), None
patent: 0 898 163 (1999-02-01), None
patent: 1 022 906 (2000-07-01), None
patent: 1 348 946 (2003-10-01), None
patent: 62/093637 (1987-04-01), None
patent: 11/248641 (1999-09-01), None
patent: 2000/009447 (2000-01-01), None
patent: 2001/261191 (2001-09-01), None
patent: 2002/243648 (2002-08-01), None
patent: WO 95/14805 (1995-06-01), None
patent: WO 98/44336 (1998-10-01), None
patent: WO 99/10833 (1999-03-01), None
patent: WO 00/07031 (2000-02-01), None
patent: WO 01/02840 (2001-01-01), None
patent: WO 01/53811 (2001-07-01), None
patent: WO 02/21105 (2002-03-01), None
patent: WO 02/065106 (2002-08-01), None
patent: WO 02/065107 (2002-08-01), None
patent: WO 03/081219 (2003-10-01), None
patent: WO 2005/065367 (2005-07-01), None
patent: WO 2005/106104 (2005-11-01), None
patent: WO 2006/066398 (2006-06-01), None
patent: WO 2007/026174 (2007-03-01), None
“A PC-Based Real Time Defect Imaging System for High Speed Web Inspection”, by J.W. Roberts, S.D.Rose, G.Jullien, L.Nichols, G.Moroscher, P.T.Jenkins, S.G.Chamberlain, R.Mantha, and D.J.Litwiller, DALSA Inc., pp. 7-29-7-41.
“Real-Time Computer Vision on PC-Cluster and Its Application to Real-Time Motion Capture”, by Daisaku Arita, Satoshi Yonemoto, and Rin-ichiro Taniguchi, Kyushu University, Japan, 2000, pp. 205-206.
Technical Paper “The Application of a Flexible Machine Vision Architecture to the Inspection of Continuous Process Materials”, by Brad Harkavy, from Vision '89 Conference, Chicago, Illinois, MS89-165, attended on Apr. 24-27, 1989.
“Flexible Circuits, Roll-to-Roll AOI” by Brian Tithecott, PC FAB, pp. 26-28, 30, and 32.
“A New Design Environment for Defect Detection in Web Inspection Systems”, by S. Hossain Hajimowlana, Roberto Muscedere, Graham A. Jullien, James W. Roberts, DALSA Inc.; SPIE vol. 3205, 1997, pp. 125-136.
“Parsytec HTS-2, Defect Detection and Classification Through Software vs. Dedicated Hardware”, by Reinhard Rinn, Scott A. Thompson, Dr. Ralph Foehr, Friedrich Luecking, and John Torre; SPIE vol. 3645; Jan. 1999, pp. 110-121.
U.S. Appl. No. 10/669,197, filed Sep. 24, 2003, Skeps et al (Co-pending application).
Wenyuan Xu et al., “Industrial Web Inspection for Manufacturing Process Understanding and Control”, Proceedings of the SPIE—The International Society for Optical engineering SPIE-INT. Soc. Opt. Eng USA, vol. 3652, Jan. 1, 1999, pp. 10-20, XP002307220, ISSN: 0277-786X, Figure 1.
International Preliminary Examination Report, PCT/US2005/009741, Mar. 23, 2005, (19 pages).
Floeder et al., “Multi-Roller Registered Repeat Defect Detection of a Web Process Line”, U.S. Appl. No. 12/207,582, filed Sep. 10, 2008.
Floeder Steven P.
Masterman James A.
Skeps Carl J.
3M Innovative Properties Company
Bella Matthew C
Bern Steven A.
Rush Eric
LandOfFree
Apparatus and method for the automated marking of defects on... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for the automated marking of defects on..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for the automated marking of defects on... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4119875