Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1996-10-24
1999-11-09
Hirshfeld, Andrew
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
374 5, 738656, G01N 360
Patent
active
059801034
ABSTRACT:
An apparatus and method for testing thermal fatigue resistance. The apparatus utilizes a unified heating device and cooling device so that the apparatus is smaller and simpler and a more even temperature distribution can be obtained. The apparatus has at least one gas duct facing the test unit and a device for supplying the duct with a compressed gas flow. A plurality of gas ducts may be used which face plural points on the test unit from plural directions. Thermocouples are placed on several points on the test unit and the temperatures of the points measured. Swift and precise testing of thermal fatigue resistance can be performed by a feedback control of each heating device based on the measured temperature. Thermal strains are caused in certain parts of the test unit due to differences of thermal expansion between members of the test unit.
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Hori Masanao
Ikuno Hajime
Hirshfeld Andrew
Kabushiki Kaisha Toyota Chuo Kenkyusho
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