Apparatus and method for testing semiconductor devices

Details Apparatus and method for testing semiconductor devices Apparatus and method for testing semiconductor devices

1988-07-11

1989-08-15

Miska, Vit W.

Horology: time measuring systems or devices

Time interval

Electrical or electromechanical

368120, 324 83R, G04F 800, G01R 2500

Patent

active

048582085

ABSTRACT:
A signal of a known period is transmitted through a semiconductor device to the set input of a flip-flop. The reset input of the flip-flop receives the original signal delayed by one-half the known period. The inverted and noninverted outputs of the flip-flop are then filtered and input to a leveling circuit and a differential amplifier. The leveling circuit adjusts the outputs of the flip-flop to produce signals of constant known amplitude. The output of the differential amplifier represents the delay of the signal through the semiconductor device.

REFERENCES:
patent: 3676777 (1972-07-01), Charters
patent: 3866126 (1975-06-01), Cebula et al.
patent: 3944938 (1976-03-01), Brouant
patent: 3969618 (1976-07-01), Strubel et al.
patent: 3984770 (1976-10-01), Chu
patent: 4118665 (1978-10-01), Reinhardt
patent: 4119910 (1978-10-01), Hayashi
patent: 4287594 (1981-09-01), Shirasaka
patent: 4293950 (1981-10-01), Shimizu et al.
patent: 4338569 (1982-07-01), Petrich
patent: 4348743 (1982-09-01), Dozier
patent: 4348759 (1982-07-01), Schnurmann
patent: 4365334 (1982-12-01), Smith et al.
patent: 4439858 (1984-03-01), Peterson
patent: 4450560 (1984-05-01), Connor
patent: 4493079 (1985-01-01), Hughes et al.
patent: 4517661 (1985-05-01), Graf et al.
patent: 4604744 (1986-08-01), Littlebury et al.
patent: 4681449 (1987-07-01), Bloom et al.
patent: 4694242 (1915-09-01), Peterson et al.
patent: 4720670 (1988-01-01), Boyle
patent: 4736351 (1988-04-01), Oliver

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