Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1991-12-11
1993-11-30
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
371 251, G01R 3128
Patent
active
052668940
ABSTRACT:
A semiconductor testing apparatus includes a comparator for receiving a signal output to a pin terminal of a semiconductor device under test through a transmission line and determining a logical level of the received signal. Semiconductor testing apparatus 1 further includes a current supply circuit for comparing a voltage of an input terminal of comparator with a reference voltage applied by reference voltage sources and supplying a current to transmission line. When a signal ringing on transmission line and a reflection with undershoot and overshoot at input terminal occur, current supply circuit supplies a current to transmission line in accordance with a relationship of magnitude between the voltage at input terminal and the reference voltage. The current supply to transmission line is made to inhibit the overshoot and undershoot of the signal. This allows comparator to carry out a functional testing and a measurement of DC/AC characteristics of a semiconductor device at precise timing and at high speed.
REFERENCES:
patent: 3159787 (1964-12-01), Sexton et al.
patent: 3982240 (1976-09-01), Waehner
Tada Tetsuo
Takagi Ryoichi
Tanaka Koji
Karlsen Ernest F.
Mitsubishi Denki & Kabushiki Kaisha
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