Thermal measuring and testing – Thermal testing of a nonthermal quantity – Expansion or contraction characteristics
Patent
1997-09-29
1999-11-16
Bennett, G. Bradley
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Expansion or contraction characteristics
374 5, G01N 2572
Patent
active
059845244
ABSTRACT:
Test apparatus heats or cools a small chamber according to a given thermal profile based on data from a thermal sensor; and the change of a component put in the chamber is measured in real time by a measuring sensor and the relationship between temperature and change in shape is displayed as its measurement results.
REFERENCES:
patent: 5052816 (1991-10-01), Nakamura et al.
patent: 5209569 (1993-05-01), Fujiwara et al.
patent: 5246291 (1993-09-01), Lebeau et al.
patent: 5251476 (1993-10-01), Gilmore et al.
patent: 5350899 (1994-09-01), Ishikawa et al.
patent: 5396068 (1995-03-01), Bethea
patent: 5528151 (1996-06-01), Perez
Ooeda Kenichi
Teshirogi Shoichi
Bennett G. Bradley
Fujitsu Limited
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