Apparatus and method for testing outputs of logic circuits by mo

Details Apparatus and method for testing outputs of logic circuits by mo Apparatus and method for testing outputs of logic circuits by mo

1986-08-18

1987-12-22

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

324133, G01R 1914

Patent

active

047148268

ABSTRACT:
Compressive, multiplicative electrical-optical system for testing high-speed, large scale logic devices. The output signals of the device are changed into optical signals which are applied to optical guided-wave light intensity modulators. Electrical reference signals of the desired, or correct, outputs are applied to the modulators to control the light passing through the modulators. The system provides a product of the actual output signal and the complement of the electrical reference signal, and a product of the complemented optical output signal and the uncomplemented electrical reference signal. The light output from the modulators during the formation of the two products is observed, with a detection of light from either product indicating that an error exists in an output channel of the device. Parallel, or simultaneous, product formation is provided in one embodiment, and sequential, or time spaced product formation, is provided in another embodiment. An acousto-optic implementation of the invention is also described.

REFERENCES:
patent: 3944921 (1976-03-01), Tsuda et al.
patent: 4218142 (1980-08-01), Krugger et al.
patent: 4242635 (1980-12-01), Burns
patent: 4408884 (1983-10-01), Kleinknecht et al.
patent: 4523143 (1985-06-01), Dvorak
patent: 4625815 (1987-03-01), Collombet

Affiliated with

Also associated with

Rating

Apparatus and method for testing outputs of logic circuits by mo does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for testing outputs of logic circuits by mo, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for testing outputs of logic circuits by mo will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-819890