Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2009-07-17
2011-11-22
Phan, Huy Q (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762060
Reexamination Certificate
active
08063654
ABSTRACT:
An integrated circuit device includes a stacked die and a base die having probe pads that directly couple to test logic of the base die to implement a scan chain for testing of the integrated circuit device. The base die further includes contacts disposed on a back side of the base die and through-die vias coupled to the contacts and coupled to programmable logic of the base die. The base die also includes a first probe pad configured to couple test input, a second probe pad configured to couple test output, and a third probe pad configured to couple control signals. Test logic of the base die is configured to couple to additional test logic of the stacked die to implement the scan chain. The probe pads are coupled directly to the test logic such that configuration of the programmable logic is not required to implement the scan chain.
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Nguyen Bang-Thu
Pan Hong-Tsz
Rahman Arifur
Benitez Joshua
Cartier Lois D.
Glass Kenneth
Maunu LeRoy D.
Phan Huy Q
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