Apparatus and method for testing non-deterministic device data

Details Apparatus and method for testing non-deterministic device data Apparatus and method for testing non-deterministic device data

2006-01-24

2006-01-24

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S116000, C702S121000, C702S182000

Reexamination Certificate

active

06990423

ABSTRACT:
Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.

REFERENCES:
patent: 5245617 (1993-09-01), DeSouza et al.
patent: 5379289 (1995-01-01), DeSouza et al.
patent: 6530054 (2003-03-01), Hollander
patent: 6601195 (2003-07-01), Chirashnya et al.
patent: 2004/0107395 (2004-06-01), Volkerink et al.

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