Apparatus and method for testing mechanical endurance of...

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Reexamination Certificate

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C369S053340

Reexamination Certificate

active

07626904

ABSTRACT:
An apparatus and method for testing mechanical endurance of a surface of an optical disc is disclosed, which includes a rotating plate on which the optical disc is fixed to generate scratch thereon, and rotating the fixed optical disc; and a plurality of abrasion wheels disposed in perpendicular to the rotating plate, and being in contact with the surface of the optical disc, to generate the scratch on the surface of the optical disc, wherein, the scratches generate when the optical disc rotates a predetermined turn, e.g. below ten turns for applying a predetermined load generated from the abrasion wheel on the optical disc.

REFERENCES:
patent: 4399192 (1983-08-01), Russell
patent: 4410978 (1983-10-01), Van Den Broek et al.
patent: 4681834 (1987-07-01), Simmons, III
patent: 4958511 (1990-09-01), Marcus
patent: 4966030 (1990-10-01), Kobayashi et al.
patent: 5074983 (1991-12-01), Eltoukhy et al.
patent: 5343733 (1994-09-01), Nakagawa et al.
patent: 5531095 (1996-07-01), Hupf
patent: 5557039 (1996-09-01), Annis et al.
patent: 5568466 (1996-10-01), Komaki et al.
patent: 5615589 (1997-04-01), Roach
patent: 5756130 (1998-05-01), Umebayashi et al.
patent: 6330820 (2001-12-01), Cotterill et al.
patent: 6412330 (2002-07-01), Dicello et al.
patent: 6502455 (2003-01-01), Gitis et al.
patent: 6576320 (2003-06-01), Hayashida et al.
patent: 6874350 (2005-04-01), Seo et al.
patent: 7188510 (2007-03-01), Seo et al.
patent: 2002/0054975 (2002-05-01), Hayashida et al.
patent: 2004/0182169 (2004-09-01), Seo et al.
patent: 2004/0226350 (2004-11-01), Kim et al.
patent: 2005/0002286 (2005-01-01), Yonezawa et al.
patent: 2005/0058040 (2005-03-01), Seo et al.
patent: 438544 (1935-11-01), None
patent: 01-143017 (1989-06-01), None
patent: 03-226648 (1991-10-01), None
patent: 06-201572 (1994-07-01), None
patent: 08-063797 (1996-03-01), None
patent: 08-233714 (1996-09-01), None
patent: 08-327523 (1996-12-01), None
patent: 10-011953 (1998-01-01), None
patent: 11-250502 (1999-09-01), None
patent: 2000-28506 (2000-01-01), None
patent: 2001-91445 (2001-04-01), None
patent: 2006-514293 (2006-04-01), None
patent: 2001-0053357 (2001-06-01), None
patent: 2002-0009786 (2002-02-01), None
patent: 2003-0001529 (2003-01-01), None
International Search Report dated Nov. 26, 2004.
KS M ISO 5470-1.
Japanese Office Action dated Jul. 21, 2009 with English translation.
Korean Office Action dated Feb. 18, 2009 with English translation.
Korean Office Action dated Feb. 19, 2009 with English translation.

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