Apparatus and method for testing integrated circuits

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 96, 324158D, G01R 100, G01R 3102

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052085317

ABSTRACT:
An apparatus and method for testing an integrated circuit (12) generally comprises an input pad (14) and output pad (15) having photo-sensitive sensors (20, 46) formed thereon for eliminating the need to come into direct contact with a probe card for testing the integrity of an integrated circuit.

REFERENCES:
patent: 3801910 (1974-04-01), Quinn
patent: 3956698 (1976-05-01), Malmberg et al.
patent: 4573008 (1986-02-01), Lischke
patent: 4588950 (1986-05-01), Henley
patent: 4760249 (1988-07-01), Baskett
patent: 4868492 (1989-09-01), Beha et al.
patent: 4875004 (1989-10-01), Boyd
patent: 4928058 (1990-05-01), Williamson
patent: 4962353 (1990-10-01), Takahashi et al.
J.-M. Halbout, et al., IBM Thomas J. Watson Research Center. Characterization of Logic Devices with Photo-Conductively Generated Picosecond Pulses, pp. 247-254 (1987).
Ravi Jain, Editor, SPIE vol. 795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits (1987) (for all following citations).
Gerard A. Mourou, Univ. of Rochester, Electro-Optic Sampling: Device Embodiments and Possibilities, pp. 300-309.
Brian H. Kolner, Hewlett-Packard Labs., Electro-Optic Sampling in Gallium Arsenide, pp. 310-316.
X.-C. Zhang, R. K. Jain, Amoco Research Ctr. Analysis of High Speed GaAs ICs with Electro-Optic Probes, pp. 317-338.
J. M. Wiesenfeld, et al., AT&T Bell Labs. Electro-Optic Sampling Using Injection Lasers, pp. 339-344.
Francois J. Henley, et al., Photon Dynamics Inc. Simple and Inexpensive Method for Testing High Speed Semiconductor Devices Using Electro-Optic Sampling, pp. 345-351.
K. W. Forsyth, et al., EG&G Princeton Applied Research, Simple and Inexpensive Method for Testing High Speed Semiconductor Devices Using Electro-Optic Sampling, pp. 352-356 (1987).

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