Apparatus and method for testing impedances of interconnect devi

Details Apparatus and method for testing impedances of interconnect devi Apparatus and method for testing impedances of interconnect devi

1987-12-28

1989-08-22

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324526, 324 62, G01R 3104

Patent

active

048599522

ABSTRACT:
In electronic devices, such as data processing systems that operate at high frequencies, the integrity of the interconnect or coupling apparatus transferring signals between component modules is critical to prevent compromise of information being transferred. However, the interconnect or coupling apparatus is subject to both long term and to short term impedance variations. Apparatus is disclosed for testing both the long term impedance changes and the rapid fluctuations that are not observable by current testing procedures. In addition, apparatus is disclosed for providing controllable rapid impedance changes to verify the operation of test apparatus, disclosed herein, for measuring the rapid impedance changes.

REFERENCES:
patent: 3636439 (1972-01-01), Colligan
patent: 3821642 (1974-06-01), Seymore
patent: 3928795 (1975-12-01), Lechner
patent: 3984768 (1976-10-01), Staples
patent: 4498044 (1985-02-01), Horn
patent: 4654580 (1987-03-01), Keller

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