Apparatus and method for testing image sensor wafers to...

Details Apparatus and method for testing image sensor wafers to... Apparatus and method for testing image sensor wafers to...

2011-08-16

2011-08-16

Lyons, Michael A (Department: 2877)

Image analysis

Applications

Manufacturing or product inspection

C356S237500, C348S187000, C702S116000

Reexamination Certificate

active

08000520

ABSTRACT:
An image sensor testing apparatus is disclosed. The image sensor testing apparatus includes an electronic test system having a light source for illuminating an image sensor wafer to generate pixel data and a host processor for receiving the pixel data. An interface card coupled to the electronic test system has a programmable processor for processing the pixel data to generate processed data, the processed data transmitted to and analyzed by the host processor together with the pixel data to detect pixel defects in the image sensor wafer.

REFERENCES:
patent: 6625558 (2003-09-01), Van Ausdall et al.
patent: 7103208 (2006-09-01), Wengender et al.
patent: 7136157 (2006-11-01), Gomm et al.
patent: 7251576 (2007-07-01), Su et al.
patent: 2001/0036305 (2001-11-01), Jun
patent: 2008/0266400 (2008-10-01), Lu et al.
patent: 2009/0096873 (2009-04-01), Hennes et al.

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