Thermal measuring and testing – Determination of inherent thermal property
Patent
1983-05-19
1985-09-17
Yasich, Daniel M.
Thermal measuring and testing
Determination of inherent thermal property
374 1, 374 12, 374164, G01F 168, G01N 2520
Patent
active
045417300
ABSTRACT:
A device and process for determining the vacuum dewar heat load at cryogenic temperatures by a test made at room temperature are described. The test device comprises a heat source and integral temperature sensor mounted on a probe tip. The heat load of a test dewar at a desired test temperature (e.g. 77K) may be determined by measuring the heat load of the dewar under test at a more suitable test temperature (e.g. room temperature) and multiplying that room temperature heat load by a correlation factor. This correlation factor is empirically determined, and is dependent on the design of the test device and dewar, and the desired and actual test temperatures.
REFERENCES:
patent: 3242716 (1966-03-01), Webb
patent: 4059982 (1977-11-01), Bowman
patent: 4221125 (1980-09-01), Oliver et al.
patent: 4255962 (1981-03-01), Ashman
Comey David M.
Kusner Ronald R.
Honeywell Inc.
Marhoefer Laurence J.
Solakian John S.
Yasich Daniel M.
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