Computer graphics processing and selective visual display system – Display with fail/safe testing feature
Reexamination Certificate
2006-07-25
2006-07-25
Shalwala, Bipin (Department: 2629)
Computer graphics processing and selective visual display system
Display with fail/safe testing feature
C345S087000, C345S098000, C345S100000, C324S530000
Reexamination Certificate
active
07081908
ABSTRACT:
In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has a MISFET having a source, a gate and a drain. Then, a first voltage is applied to the target electrode such that a gate voltage is induced at the gate by electrostatic induction. Also, a second voltage is applied to at least one of the source and the drain such that current flows between the source and the drain based on the gate voltage. Then, a value of the current is examined to determine an electrical connection state of the target electrode.
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Nobuo Fujii, vol. 13, pp. 41-42, “Analog Electronic Circuit INI Integrated Circuit ERA”, May 10, 1990.
Doi Takashi
Egashira Yoshio
Murakawa Shinichi
Ueda Shigeo
Lewis David L.
Mitsubishi Heavy Industries Ltd.
Oblon, Spivak, McClelland, Maier & Neustadt
Shalwala Bipin
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