Apparatus and method for terminating probe apparatus of...

Details Apparatus and method for terminating probe apparatus of... Apparatus and method for terminating probe apparatus of...

2005-11-08

2005-11-08

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S1540PB

Reexamination Certificate

active

06963207

ABSTRACT:
A method and apparatus for terminating a probe that probes a semiconductor device with a signal cable from a tester is provided to connect layers of the probe to layers of the signal cable side by side. The probe and signal cable can be a co-axial or tri-axial probe and signal cable, respectively. A center conductive probe needle of the probe is disposed side by side with and electrically connects to a center signal conductor of the signal cable. A dielectric layer of the probe is disposed side by side with and connects to a dielectric layer of the signal cable. A conductive guard layer of the probe is disposed side by side with and electrically connects to a conductive dispersion/guard layer of the signal cable, and a sleeve of the probe is disposed side by side with and connects to a sleeve of the signal cable. In a tri-axial embodiment, a second dielectric layer of the probe is disposed side by side with and connects to a second dielectric layer of the signal cable.

REFERENCES:
patent: 3963986 (1976-06-01), Morton et al.
patent: 4480223 (1984-10-01), Aigo
patent: 4731577 (1988-03-01), Logan
patent: 4845426 (1989-07-01), Nolan et al.
patent: 5397996 (1995-03-01), Keezer
patent: 5525911 (1996-06-01), Marumo et al.
patent: 5729150 (1998-03-01), Schwindt
patent: 6075376 (2000-06-01), Schwindt
patent: 6124723 (2000-09-01), Costello
patent: 6137302 (2000-10-01), Schwindt
patent: 6201402 (2001-03-01), Root
patent: 6276956 (2001-08-01), Cook
patent: 6586954 (2003-07-01), Root
patent: 6603322 (2003-08-01), Boll et al.
patent: 2001/0011902 (2001-08-01), Schwindt
patent: 0 177 809 (1986-04-01), None
patent: WO 99/04273 (1999-01-01), None

Affiliated with

Also associated with

Rating

Apparatus and method for terminating probe apparatus of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for terminating probe apparatus of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for terminating probe apparatus of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3504213