Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-05-29
2007-05-29
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
11055213
ABSTRACT:
Temperature measurement of an integrated circuit may be made using a bandgap voltage reference. In one example, a circuit includes a bandgap reference, a first output terminal, a second output terminal, and a calculation circuit. The bandgap reference includes a first amplifier having a first amplifier input coupled to a first transistor and a second amplifier input coupled to a second transistor. The first output terminal is coupled to the first and second transistors and is operable to provide a temperature independent voltage. The second output terminal is operable to provide a temperature dependent voltage. The calculation circuit is coupled to the first output terminal and the second output terminal and is configured to subtract from the temperature dependent voltage a difference between the temperature independent voltage and a nominal temperature independent voltage.
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Ascolese Marc R.
Barlow John
Brush Robert
Lau Tung S.
Xilinx , Inc.
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