Electricity: electrical systems and devices – Safety and protection of systems and devices – Circuit interruption by thermal sensing
Reexamination Certificate
2008-05-06
2008-05-06
DeBeradinis, Robert L. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Circuit interruption by thermal sensing
C361S104000, C361S105000, C361S106000, C361S093800, C361S124000
Reexamination Certificate
active
07369387
ABSTRACT:
An apparatus and method for temperature-dependent transient blocking employing a transient blocking unit (TBU) that uses at least one depletion mode n-channel device interconnected with at least one depletion mode p-channel device. The interconnection is performed such that a transient alters a bias voltage Vpof the p-channel device and a bias voltage Vnof the n-channel device in concert to effectuate their mutual switch off to block the transient. The apparatus has a temperature control unit that is in communication with the TBU and adjusts at least one of the bias voltages Vp, Vnin response to a sensed temperature Ts, thereby enabling the apparatus to also respond to over-temperature. In some embodiments the p-channel device is replaced with a positive temperature coefficient thermistor (PTC). The temperature control unit can use any suitable circuit element, including, among other a PTC, resistor, negative temperature coefficient element, positive temperature coefficient element, transistor, diode.
REFERENCES:
patent: 3916220 (1975-10-01), Roveti
patent: 4142115 (1979-02-01), Nakata et al.
patent: 4533970 (1985-08-01), Brown
patent: 4811156 (1989-03-01), Kroll
patent: 5130262 (1992-07-01), Masquelier et al.
patent: 5196980 (1993-03-01), Carson
patent: 5319515 (1994-06-01), Pryor et al.
patent: 5625519 (1997-04-01), Atkins
patent: 5696659 (1997-12-01), Maruo
patent: 5729418 (1998-03-01), Lei
patent: 5742463 (1998-04-01), Harris
patent: 5789900 (1998-08-01), Hasegawa et al.
patent: 5929665 (1999-07-01), Ichikawa et al.
patent: 6002566 (1999-12-01), Arikawa et al.
patent: 6100745 (2000-08-01), Dougherty
patent: 6118641 (2000-09-01), Atkins et al.
patent: 6157529 (2000-12-01), Ahuja
patent: 6181541 (2001-01-01), Souri et al.
patent: 6313610 (2001-11-01), Korsunsky
patent: 6331763 (2001-12-01), Thomas et al.
patent: 6351360 (2002-02-01), Kotowski et al.
patent: 6518731 (2003-02-01), Thomas et al.
patent: 6714393 (2004-03-01), Nostrand
patent: 6768623 (2004-07-01), Shen
patent: 6855988 (2005-02-01), Madurawe
patent: 6861828 (2005-03-01), Watanabe
patent: 6865063 (2005-03-01), Ball
patent: 6914416 (2005-07-01), Thomas et al.
patent: 6948078 (2005-09-01), Odaohhara
patent: 6958591 (2005-10-01), Smith
patent: 6963477 (2005-11-01), Ikeda
patent: 6970337 (2005-11-01), Strahm
patent: 7061739 (2006-06-01), Hastreiter et al.
patent: A-75035/91 (1991-11-01), None
patent: 3805811 (1988-09-01), None
patent: 4022253 (1992-01-01), None
patent: 4402461 (1995-08-01), None
patent: 4494617 (1996-11-01), None
patent: 0818867 (1998-01-01), None
patent: DE 0862255 (1998-02-01), None
patent: 2294598 (1995-01-01), None
patent: 1991053613 (1991-07-01), None
patent: WO9501667 (1995-01-01), None
patent: WO0101539 (2001-01-01), None
patent: WO03069753 (2003-08-01), None
patent: WO2004006408 (2004-01-01), None
patent: WO2004034544 (2004-04-01), None
Coates Stephen
Harris Richard A.
Hebert Francois
DeBeradinis Robert L.
FulTec Semiconductor, Inc.
Lumen Patent Firm, Inc.
Willoughby Terrence R.
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