Apparatus and method for surface property measurement with...

Measuring and testing – Hardness – By penetrator or indentor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07568381

ABSTRACT:
The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like. The apparatus includes a substantially rigid base; a stylus coupled to the substantially rigid base, the stylus configured and selectively positioned to interact with a surface of a specimen at points along a central axis of the stylus; a proximity detector sensor coupled to the substantially rigid base, the proximity detector sensor disposed at a predetermined distance from the surface of the specimen and operable for sensing the predetermined distance between the proximity detector sensor and the surface of the specimen; and a proximity detector actuator coupled to the substantially rigid base, the proximity detector actuator operable for maintaining the predetermined distance between the proximity detector sensor and the surface of the specimen as the substantially rigid base and the stylus are moved with respect to the surface of the specimen along the central axis of the stylus.

REFERENCES:
patent: 5955661 (1999-09-01), Samsavar et al.
patent: 6691564 (2004-02-01), Anderberg
patent: 6734425 (2004-05-01), Hantschel et al.
patent: 7091476 (2006-08-01), Kley
patent: 2001/0000279 (2001-04-01), Daniels et al.
patent: 2004/0051542 (2004-03-01), Miles et al.
patent: 2005/0005688 (2005-01-01), Samsavar et al.
patent: 2005/0050947 (2005-03-01), Kitajima et al.
patent: 2005/0066714 (2005-03-01), Adderton et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for surface property measurement with... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for surface property measurement with..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for surface property measurement with... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4118402

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.