Apparatus and method for surface inspection with test and refere

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356368, G02F 101, H01J 4014

Patent

active

048453560

ABSTRACT:
Apparatus for comparing a test surface 23 with a reference surface 8 comprising detector means 16.17, a test channel TC for receiving radiation from the test surface 23 and a reference channel RC for receiving radiation from the reference surface 8. A selector means 12 is provided to pass radiation from the test channel means TC and the reference channel means RC to the detector means. Varying means 5 is provided to vary the radiation passed along the test channel TC and reference channel RC. Cycle means is provided to cycle the selector means 12 between a first state in which more radiation from the test channel TC than the reference channel RC is passed to the detector means and vice versa. Control means is provided to control the radiation varying means 5 to provide a zero or minimum variation of radiation received by the detector means as the selector means 12 is cycled.

REFERENCES:
patent: 3743431 (1973-07-01), Cushing et al.
patent: 3892494 (1975-07-01), Baker et al.
patent: 4714348 (1987-12-01), Makosch

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for surface inspection with test and refere does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for surface inspection with test and refere, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for surface inspection with test and refere will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-854675

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.