Apparatus and method for sub-ranging conversion for...

Details Apparatus and method for sub-ranging conversion for... Apparatus and method for sub-ranging conversion for...

2006-08-08

2006-08-08

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

C341S118000, C341S119000, C341S120000, C341S136000, C374S178000, C374S183000, C257S467000, C438S237000

Reexamination Certificate

active

07089146

ABSTRACT:
A circuit for temperature sensing receives a differential voltage that corresponds to the voltage across a forward-biased PN junction. The circuit for temperature sensing provides a first current to the PN junction, and subsequently provides a second current. Also, the temperature of the PN junction is determined based on the difference between the differential voltage when the first current is applied and the differential voltage when the second current is applied. Further, the circuit for temperature sensing self-biases half of the differential signal. The other half of the differential signal is level-shifted by an amount that is fixed and predetermined based on the self-biasing to provide a sub-ranging voltage. A sub-ranging analog-to-digital conversion is performed on the differential voltage in which the sub-ranging voltage is subtracted from the differential voltage during the conversion.

REFERENCES:
patent: 6149299 (2000-11-01), Aslan et al.
patent: 6480127 (2002-11-01), Aslan
National Semiconductor Corporation, “± 0.75° C. Accurate, Remote Diode and Local Digital Temperature Sensor with Two-Wire Interface”, LM86, Apr. 2003, pp. 1-21.

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