Radiant energy – Electrically neutral molecular or atomic beam devices and...
Patent
1986-01-31
1987-10-13
Anderson, Bruce C.
Radiant energy
Electrically neutral molecular or atomic beam devices and...
250397, 2504911, H01S 100, H01S 900, H01J 37147
Patent
active
047000686
ABSTRACT:
A system and method is described for obtaining a spatial characterization of a particle beam, including the beam direction, position, divergence, aberrations and intensity profile. A mechanism is also provided for adjusting the beam propagation to a desired state in response to the sensed characteristics. A fiber array in the path of a neutral particle beam casts shadows which are sensed at a downstream location to characterize the beam. Various mechanisms can be used to sense the shadow positions and/or widths relative to the fibers, from which the various beam characteristics can be derived. By magnetically removing charged particles from the neutral beam shadows, the shadows can be sensed by their effect upon the secondary emission currents generated in downstream conducting sensor wires, by their effect upon the fluorescence of downstream optical fibers, or by their effect upon the thermal heating of various types of downstream heat sensors. The shadows can also be sensed directly by the differences in their spectral radiation compared to that of the beam. A very high degree of precision is obtained in directing the beam, while initial coarse measurements and adjustments can be derived by providing the fiber array as a grid of conductive wires and sensing differentials in the secondary emission currents generated in the various wires.
REFERENCES:
patent: 3742219 (1973-06-01), Damm et al.
patent: 3838284 (1974-09-01), McIntyre et al.
patent: 4140576 (1979-02-01), Fink et al.
patent: 4260895 (1981-04-01), Bakkler et al.
patent: 4260897 (1981-04-01), Bakkler et al.
patent: 4502937 (1985-03-01), Yagi
"High Intensity Beam Profile Monitor for the LAMPF Primary Beam Lines," by E. W. Hoffman et al., in IEEE Transactions on Nuclear Science, vol. NS-26, No. 3, Jun. 1979.
"Recent Improvements in Beam Diagnostic Instrumentation," by O. R. Sander et al., in IEEE Transactions on Nuclear Science, vol. NS-No. 3, Jun. 1979.
"Secondary Emission Monitors at the BEVATRON-BEVALAC," by John J. Barale et al., in IEEE Transactions on Nuclear Science, vol. NS-26, No. 3, Jun. 1979.
McClung, Jr. Frederick J.
Small James G.
Anderson Bruce C.
Hughes Aircraft Company
Karambelas A. W.
Taylor Ronald L.
LandOfFree
Apparatus and method for spatially characterizing and controllin does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for spatially characterizing and controllin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for spatially characterizing and controllin will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-412826