Apparatus and method for soft error comparison testing

Details Apparatus and method for soft error comparison testing Apparatus and method for soft error comparison testing

1996-09-09

1998-12-15

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3128

Patent

active

058501452

ABSTRACT:
A method and apparatus for soft error comparison testing of electronic components exposed to a flux of high energy particles, while providing for simultaneous comparison testing of different components at full rated operating speed, and providing for programmable control of level of the supply voltage applied to the components. Included a method and apparatus for simultaneously exposing electronic components to a flux of high energy particles, operating the components, and simultaneously measuring soft errors of the components induced by the flux of high energy particles.

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Craig Lage, et al., "Soft Error Rate and Stored Charge Requirements in Advanced-High-Density SRAMs", article, IEEE, 0-7803-1450-6, pp. 33.4.1-33.4.4, 1993 (Unavailable Month).
Timothy J. O'Gorman, "The Effect of Cosmic Rays on the Soft Error Rate of a DRAM at Ground Level", article, IEEE, 0018-9383/94, pp. 553-557, 1994 (Unavailable Month).
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J.F. Ziegler, et al., "IBM experience in soft fails in computer electronics (1978-1994)", article, IBM J. Res. Develop., vol. 40, No. 1, pp. 3-18, Jan. 1996.
J.F. Ziegler, et al., "Accelerated testing for cosmic soft-error rate", article, IBM J. Res. Develop., vol. 40, No. 1, pp. 51-72, Jan. 1996.
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