Apparatus and method for sensing material level by capacitance m

Details Apparatus and method for sensing material level by capacitance m Apparatus and method for sensing material level by capacitance m

1995-05-15

1996-09-10

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324671, 324678, 320 1, 73304C, G01R 2726, G01F 2326

Patent

active

055549373

ABSTRACT:
A highly accurate system to measure the level of material in a vessel. A probe is provided in the vessel. The vessel and the probe are at different potentials so as to create a capacitance therebetween. The air and materials in the vessel act as dielectrics. As the material level varies, so does the capacitance. This capacitance is subjected to a charge-discharge-charge cycle yielding integrated net neutral charge. The duration of the cycle is compared to a reference time to determine capacitance, which is proportional to the level of material in the vessel.

REFERENCES:
patent: 3778708 (1973-12-01), Anders et al.
patent: 3993947 (1976-11-01), Maltby et al.
patent: 4146834 (1979-03-01), Maltby et al.
patent: 4499766 (1985-02-01), Fathauer et al.
patent: 4558274 (1985-12-01), Carusillo
patent: 4939519 (1990-07-01), Elbert
patent: 4942401 (1990-07-01), Gessaman et al.
patent: 4968946 (1990-11-01), Maier
patent: 5014011 (1991-05-01), Colvin
patent: 5045797 (1991-09-01), Kramer et al.
patent: 5278513 (1994-01-01), Kramer et al.
patent: 5294889 (1994-03-01), Heep et al.
patent: 5446444 (1995-08-01), Lease

Affiliated with

Also associated with

Rating

Apparatus and method for sensing material level by capacitance m does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for sensing material level by capacitance m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for sensing material level by capacitance m will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1323326