Apparatus and method for real-time spectral alignment for open-p

Details Apparatus and method for real-time spectral alignment for open-p Apparatus and method for real-time spectral alignment for open-p

1996-11-04

1998-08-04

Nelms, David C.

Optics: measuring and testing

By particle light scattering

With photocell detection

356345, G01B 902

Patent

active

057902500

ABSTRACT:
An improved open-path fast Fourier infrared spectrometer includes a circuit or algorithm which performs real-time, spectral alignment on measured interferograms to reduce measuremental errors. The improved spectrometer measures selected water vapor lines in a measurement path and compares the centerline of these measured water vapor lines to a reference library. From two or more such comparisons within the spectrometer bandwidth, the spectrometer calculates correction factors for the entire bandwidth. The improved spectrometer performs an overlap and add algorithm which applies the correction factors to perform bandwidth segment-specific shifts on subsequently measured interferograms.

REFERENCES:
patent: 5247342 (1993-09-01), Tamura et al.
patent: 5563982 (1996-10-01), Wang et al.
Douglas, F. Elliot, Handbook of Digital Signal Processing Engineering Applications, 234-245, 633-673 (1987).
David M. Haaland and Robert G. Easterling, Application of New Least-squares Methods for the Quantitative Infrared Analysis of Multicomponent Samples, 665-673, Applied Spectroscopy vol. 36, No. 6, (1982).
C. David Wang, Comparison of Phase Error Correction Techniques for Fourier Transform Spectrometers, 3-17 to 3-26 Topics in Engineering, vol. VII (1996).

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