Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-12-17
1999-09-28
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356358, G01B 902
Patent
active
059597305
ABSTRACT:
An improved method for use with an open-path fast Fourier infrared spectrometer performs real-time, spectral alignment on measured interferograms to reduce measuremental errors. The improved method includes the step of selecting a plurality of water-vapor lines in a defined spectral region and comparing the centerline of these measured water vapor lines to a reference library. From these comparisons, the spectrometer calculates correction factors to apply to the spectrometer bandwidth. The improved spectrometer performs transform functions on selected segments of the spectrometer bandwidth which introduce integer-continuous corrective shifts on subsequently measured interferogram data.
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patent: 5790250 (1998-08-01), Wang et al.
Douglas F. Elliott, Handbook of Digital Signal Processing Engineering Applications, 234-237, 633-673 (1987).
David M. Haaland and Robert G. Easterling, Application of New Least-squares Methods for the Quantitative Infrared Analysis of Multicomponent Samples, 665-673, Applied Spectroscopy vol. 36, No. 6, (1982).
C. David Wang, Comparison of Phase Error Correction Techniques for Fourier Transform Spectrometers, 3-17 to 3-26, Topics in Engineering, vol. VII (1996).
Kagann Robert Howard
Wang Chung-Tao David
Ail Systems, Inc.
Kim Robert H.
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