Weighing scales – Processes
Reexamination Certificate
2004-10-22
2008-10-07
Gibson, Randy W (Department: 2841)
Weighing scales
Processes
C177S2100EM, C177SDIG011, C356S239400, C702S137000, C073S865000
Reexamination Certificate
active
07432453
ABSTRACT:
This invention relates to a method and apparatus for mass and/or volume measurements of manufactured articles. More particularly, this invention relates to a method and apparatus for mass and/or volume measurements that can be performed on-line in a part manufacturing process. On-line measurement of the mass or volume of material contained in a specific region of interest of the manufactured items is performed 100% on-line. Real-time process control information is based on real-time measurement of the mass or volume of material contained in a specific region of interest of a manufactured item. Automated quality control inspection for manufactured articles is based on real-time measurement of the mass or volume of material contained in a specific region of interest of manufactured items. A manufacturing closed-loop process is directly corrected to keep it within control limits based on real-time measurement of the mass or volume of material contained in a specific region of interest of manufactured items soon after these items are manufactured.
REFERENCES:
patent: 3684089 (1972-08-01), McMeekin
patent: 4304995 (1981-12-01), Huttunen et al.
patent: 4486136 (1984-12-01), Howard
patent: 4510389 (1985-04-01), Fumoto
patent: 4720808 (1988-01-01), Repsch
patent: 5095204 (1992-03-01), Novini
patent: 5138178 (1992-08-01), Wong et al.
patent: 5291271 (1994-03-01), Juvinall et al.
patent: 5291422 (1994-03-01), Esztergar
patent: 5349435 (1994-09-01), Hall et al.
patent: 5354984 (1994-10-01), Baldwin
patent: 5466927 (1995-11-01), Kohler et al.
patent: 5585603 (1996-12-01), Vogeley, Jr.
patent: 5591462 (1997-01-01), Darling et al.
patent: 6211952 (2001-04-01), Weiland et al.
patent: 6424414 (2002-07-01), Weiland et al.
patent: A-05-099861 (1993-04-01), None
patent: A-07-103916 (1995-04-01), None
patent: A-08-054354 (1996-02-01), None
patent: WO 01/65204 (2001-09-01), None
patent: WO 02/33349 (2002-04-01), None
Letter to customers entitled “Introducing PETWall—on-line wall thickness monitoring system” signed by David Dineff of Agr TopWave (available at least as early as Jan. 24, 2002).
PETWall product literature distributed by Agr TopWave (available at least as early as Jan. 24, 2002).
Product literature for Agr TopWave entitled “Quality Testing Systems for Plastic Containers and Preforms” (available at least as early as Jan. 24, 2002).
Literature of Agr TopWave for “Hand Held Thickness Probe 2000” (available at least as early as Jan. 24, 2002).
Letter to customers from Agr TopWave from David Dineff (Nov. 15, 2000).
Press release regarding “Non-Contact Measurement”, B & P News Pages, International Bottler & Packer (Dec. 2000).
Product literature of Agr TopWave for “Hand Held Thickness Probe 2000” (available at least as early as Jan. 24, 2002).
International Search Report mailed Sep. 5, 2003 corresponding to International Application No. PCT/US03/03663.
Cech Steven D.
Cochran Don W.
Fay Sharpe LLP
Gibson Randy W
Pressco Technology Inc.
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