Apparatus and method for providing ions to a mass analyzer

Radiant energy – Ionic separation or analysis – With sample supply means

Reexamination Certificate

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C250S281000, C250S282000

Reexamination Certificate

active

07741600

ABSTRACT:
A method and apparatus for directing ions from an ionization source to a mass analyzer is provided. The method includes producing ions from a sample in an ionization source. Some of the ions are transferred to a first region via a passageway that is in fluid communication with the ionization source. Next, some of the ions are sampled from the first region into a second region via an aperture that is defined thorough a partition element. The aperture is centered about a longitudinal axis that passes through an ion transfer element within the second region. An electric field is established for deflecting some of the ions that pass through the aperture of the partition element. In particular, the electric field is directed transverse to the longitudinal axis such that relatively more ions enter an input end of the ion transfer element compared to when the ions are not deflected.

REFERENCES:
patent: 5432343 (1995-07-01), Gulcicek et al.
patent: 6188065 (2001-02-01), Takada et al.
patent: 6903334 (2005-06-01), Makarov et al.
patent: 6953928 (2005-10-01), Vestal et al.
patent: 2004/0108450 (2004-06-01), Makarov et al.

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