Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1989-07-17
1991-08-13
Turner, Samuel
Optics: measuring and testing
By particle light scattering
With photocell detection
364576, G01B 902
Patent
active
050392220
ABSTRACT:
Apparatus and a method for producing Fourier spectra for a test object utilizing a plurality of laser interference signals each having a period corresponding to a wavelength of a laser beam and being out of phase by 1
of the wavelength of the laser beam, n being a positive integer above 1. An infrared interference signal representing the test object after the test object is irradiated with an infrared light beam is sampled at a time interval corresponding to 1
of the wavelength of the at least one laser interference signal and n sets of sampled data corresponding to the infrared interference signal are produced. Each set of sampled data is Fourier-transformed independently from the other to generate a Fourier spectrum corresponding to each set. All of the independently generated Fourier spectra are later combined to produce a Fourier spectrum corresponding to the infrared interference signal.
REFERENCES:
patent: 4511986 (1985-04-01), Bellar et al.
patent: 4792230 (1988-12-01), Naganuma et al.
patent: 4847878 (1989-07-01), Badeau
Fuji Electric & Co., Ltd.
Turner Samuel
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