Apparatus and method for processing particle images and...

Details Apparatus and method for processing particle images and... Apparatus and method for processing particle images and...

2008-04-01

2008-04-01

Mehta, Bhavesh M (Department: 2624)

Image analysis

Pattern recognition

Feature extraction

C382S199000, C382S203000, C382S204000, C382S206000, C382S286000

Reexamination Certificate

active

10966122

ABSTRACT:
A method for processing particle images are described that include: receiving image information obtained by capturing an image of a particle; determining the circumferential length and number of inflection points in the contour of a particle image based on the received image information; and calculating the degree of irregularity of the particle based on the determined circumferential length and number of inflection points.

REFERENCES:
patent: 5166537 (1992-11-01), Horiuchi et al.
patent: 5721433 (1998-02-01), Kosaka
patent: 6246786 (2001-06-01), Nishikiori et al.
patent: 6522781 (2003-02-01), Norikane et al.
patent: 6546352 (2003-04-01), Jahn
patent: 6662117 (2003-12-01), Naito

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