Apparatus and method for positioning an integrated circuit...

Details Apparatus and method for positioning an integrated circuit... Apparatus and method for positioning an integrated circuit...

2005-03-01

2005-03-01

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06861857

ABSTRACT:
An apparatus and method for positioning an integrated circuit (IC) for test in a test assembly. An IC positioning mechanism is provided that permits ready resetting of the position of the device that mounts an IC onto a test socket, thereby permitting efficient modification of a test assembly to accept different sized ICs. A mechanism for preventing inadvertent opening of the test assembly is also disclosed.

REFERENCES:
patent: 5340011 (1994-08-01), Sanchez
patent: 5557212 (1996-09-01), Isaac et al.
patent: 6064214 (2000-05-01), Self

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