Apparatus and method for pixel binning in an image sensor

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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Reexamination Certificate

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07091466

ABSTRACT:
Embodiments provide structures and methods for binning pixel signals of a pixel array. Pixel signals for pixels in an element of the array are binned simultaneously. Pixels in an element are located in a plurality of rows and columns. In exemplary embodiments, pixel voltage signals or pixel current signals are binned.

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Faycal Saffih et al.—“Multiresolution CMOS Image Sensor,” Technical Digest of SPIE Opto-Canada, May 2002, pp. 425-428.
Zhimin Zhou et al.—“Frame-Transfer CMOS Active Pixel Sensor with Pixel Binning,” IEEE Transactions on Electron Devices, vol. 44, No. 10, Oct. 1997, pp. 1764-1768.

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