Radiant energy – Luminophor irradiation
Patent
1987-01-12
1989-01-03
Howell, Janice A.
Radiant energy
Luminophor irradiation
250341, 2504591, G01J 300
Patent
active
RE0328219
ABSTRACT:
An apparatus, for photo-luminescent analysis of the surface of crystalline silicon, is disclosed, in which the photons emitted from the sample are passed through a two-beam (or two-arm) interferometer, having the usual beamsplitter, fixed mirror, and movable mirror. The interferometer output is directed to a detector which is a germanium photo-diode, cooled in a Dewar, which also cools the initial electronic circuitry to which the detector output is input. Using the disclosed apparatus, methods are available for readily eliminating the negative effect of the electron-hole-dropler phenomenon, and for utilizing the [no-photon] no-phonon region of the spectrum to identify otherwise unidentified impurity (or dopant) materials.
REFERENCES:
patent: 4108716 (1978-08-01), Pritchard et al.
patent: 4492871 (1985-01-01), Tajima
patent: 4542295 (1985-09-01), Mattson et al.
S. M. Davidson, T. J. Cumberbatch, E. Huang, and S. Myhajlenko, "A New Scanning Cathodoluminescence Microprobe System", Institute of Physics Conf. Ser. No. 60, Sect. 4; Paper presented at Microsc. Semicond. Mater. Conf., Oxford, England [GB] (10 Apr. 1981) pp. 191-196.
T. J. Cumberbatch, S. M. Davidson, and S. Myhajlenko, "Cathodoluminescence Imaging of Silicon", Institute of Physics Conf. Ser. No. 60, Sect. 4; Paper presented at Microsc. Semicond. Mater. Conf., Oxford, England [GB] (10 Apr. 1981) pp. 197-202.
W. K. Yuen and G. Horlick, "Atomic Spectrochemical Measurements with a Fourier Transform Spectrometer", Analytical Chemistry, vol. 49, No. 9 (Aug. 1977) pp. 1446-1448.
R. H. Hancock and D. J. Baker, "Infrared Prism Interferometer Spectrometer Using a Gas-Lubricated Drive Bearing", Infrared Physics, vol. 14, No. 4 (Nov. 1974) pp. 259-269.
J. F. Black, C. J. Summers, and B. Sherman, "Scanned-Laser Microscope for Photoluminescence Studies", Applied Optics, vol. 11, No. 7 (Jul. 1972) pp. 1553-1562.
Mme Janine Connes, "Spectroscopic Studies Using Fourier Transformation", U.S. Naval Ordnance Test Station, NAVWEPS Repact 8099, China Lake, California (Jan. 1963) pp. 139-148, [Translation from the French of Revue d'Optique, vol. 40 (1961)].
James L. Lauer, Melvin E. Peterkin, "Infrared Emission Micro-Interferometry-Evidence for Alignment of Fluid Bearing Lubricants", American Laboratory, vol. 9, No. 11 (Nov. 1977), pp. 29-37.
Hammond, R. B. et al., "Onsets of the Electron-Hole Droplet Luminescence in ", Physical Review Letters, vol. 42, No. 8, (Feb. 1979), pp. 523-526.
Mertz, L., "Improved Polarization Interferometer for Fourier Spectroscopy", Optics Communications, vol. 6, No. 4 (Dec. 1972), pp. 353-355.
Transformations in Optics, John Wiley and Sons (1965), New York, pp. 1-16.
Sakai, H., "Consideration of the Signal to Noise Ratio in Fourier Spectroscopy", Aspen Int'l. Conference on Fourier Spectroscopy (1970), pp. 19, 28.
Thewalt, M. L. W., "Details of the Structure of Bound Excitons and Bound Multiexciton Complexes in Si", Canadian Journal of Physics, vol. 55, No. 17 (Sep. 1977), pp. 1463-1480.
Vanasse, G. A. et al, Spectrometric Techniques, Academic Press (1977), vol. 1, pp. 1-3, 24-28, 69-70 et al.
Wolfe, J. P. et al., "Excitonic Matter", Scientific American (Mar. 1984), pp. 98-107.
Hannaher Constantine
Howell Janice A.
Plante Thomas L.
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