Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-07
2011-06-07
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07956634
ABSTRACT:
The present invention provides an apparatus and method for performing an ion concentration analysis in an LCD panel. The method comprises: adjusting common voltage of an LCD panel to be tested and a standard LCD panel, respectively, and obtaining a first common voltage of the LCD panel to be tested and a first common voltage of the standard LCD panel; adjusting the first common voltage of the standard LCD panel and the first common voltage of the LCD panel to be tested, respectively, according to a predetermined testing voltage; loading a first image to the standard LCD panel and the LCD panel to be tested, respectively, and maintaining the first image in the standard LCD panel and the LCD panel to be tested for a period of time; switching the loaded first image to a second image; and analyzing ion concentration in the LCD panel to be tested on the basis of image sticking levels appearing in the standard LCD panel and the LCD panel to be tested.
REFERENCES:
patent: 5734158 (1998-03-01), Nagashima et al.
patent: 7545162 (2009-06-01), Chung
Beijing Boe Optoelectronics Technology Co., Ltd.
Ladas & Parry LLP
Nguyen Ha Tran T
Nguyen Tung X
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