Apparatus and method for performing a four-point voltage...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S719000, C324S724000

Reexamination Certificate

active

11241823

ABSTRACT:
A method and apparatus for determining a voltage, such as a bias voltage, supplied by an integrated circuit. A nominal terminating resistor is connected across a first and a second input/output pads from which the voltage is supplied. The voltage is measured across third and fourth pads connected, respectively, to the first and second pads. In an alternative embodiment the functionality of the third and the fourth pads is multiplexed between chip operational circuitry unrelated to the voltage to be measured and a connection to the first and second pads for measuring the voltage.

REFERENCES:
patent: 4703252 (1987-10-01), Perloff et al.
patent: 4816768 (1989-03-01), Champlin
patent: 4989154 (1991-01-01), Yamashita et al.
patent: 5691648 (1997-11-01), Cheng
patent: 6154041 (2000-11-01), Cheng
patent: 6297653 (2001-10-01), Hembree
patent: 6943571 (2005-09-01), Worledge
patent: 2006/0066322 (2006-03-01), Fitzgerald et al.

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