Apparatus and method for pattern recognition

Optics: measuring and testing – By shade or color – Trichromatic examination

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356407, 356419, 356425, 356 73, 364526, G01J 351

Patent

active

050627147

ABSTRACT:
A densitometer apparatus (210) is disclosed and is adapted to provide color density measurements of object samples. The densitometer apparatus (210) comprises a source light (578) for projecting light toward an object sample comprising a control strip (588, 620). A reflection optics assembly (576) is adapted to measure light density reflected from the object sample, when the object sample is in the form of a paper control strip. A transmission optics assembly (618) is adapted to measure transmission density of light rays projected through the object sample, when the object sample is in the form of a film control strip. A motor assembly (426) automatically moves the object sample (588,620) through the apparatus (210) adjacent the source light (578). Pattern definition data is prestored in memory of the apparatus (210). When control strips (588, 620) to be analyzed are "read" through the apparatus (210), a pattern recognition process is employed to compare strip color patches with the prestored data, so as to determine whether the control strip "matches" the pattern definition. The pattern definition data is stored so as to define "regions" where dimensional, positional and spectral color patch properties are within predetermined tolerances. An initial step of the pattern recognition process is to scan measured data representative of the control strip and assign regions. Comparisons of the pattern definition region data and measured control strip region data are then performed to determine whether an appropriate "match" has been obtained.

REFERENCES:
patent: 2287322 (1942-06-01), Nelson
patent: 3814932 (1974-06-01), Anati et al.
patent: 3995958 (1976-12-01), Pfahl et al.
patent: 4165180 (1979-08-01), Failes
patent: 4239393 (1980-12-01), Tobias
patent: 4310248 (1982-01-01), Meredith
patent: 4334241 (1982-06-01), Kashioka et al.
patent: 4349279 (1982-09-01), Jung
patent: 4402611 (1983-09-01), Yuasa
patent: 4414635 (1983-11-01), Gast et al.
patent: 4417818 (1983-11-01), Weisner
patent: 4474470 (1984-10-01), Brandt et al.
patent: 4488245 (1984-12-01), Dalke et al.
patent: 4488808 (1984-12-01), Kato
patent: 4494875 (1985-01-01), Schramm et al.
patent: 4630225 (1986-12-01), Hisano
patent: 4654794 (1987-03-01), O'Brien
patent: 4671661 (1987-06-01), Ott
patent: 4720870 (1988-01-01), Billiotte et al.
patent: 4771468 (1988-09-01), Batchelder et al.
patent: 4773761 (1988-09-01), Sugiyama et al.
patent: 4834541 (1989-05-01), Yamaba
patent: 4849914 (1989-07-01), Medioni et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for pattern recognition does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for pattern recognition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for pattern recognition will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-495234

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.