Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2006-10-20
2010-11-02
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
07826047
ABSTRACT:
The present invention provides a variety of optical functions so as to be applicable to various kinds of objects to be inspected. For each of the optical functions, the invention accumulates contrasts (brightness differences), etc. of defects to be detected (DOI) and false defects not to be detected (nuisance), and efficiently selects parameters advantageous for inspection with high sensitivity and low nuisance ratio. A wavelength band, an illumination scheme, and filtering parameters can be selected for an optical system.
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Maeda Shunji
Shibata Yukihiro
Antonelli, Terry Stout & Kraus, LLP.
Hitachi High-Technologies Corporation
Toatley Jr. Gregory J
Valentin Juan D
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