Apparatus and method for optical inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Reexamination Certificate

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07826047

ABSTRACT:
The present invention provides a variety of optical functions so as to be applicable to various kinds of objects to be inspected. For each of the optical functions, the invention accumulates contrasts (brightness differences), etc. of defects to be detected (DOI) and false defects not to be detected (nuisance), and efficiently selects parameters advantageous for inspection with high sensitivity and low nuisance ratio. A wavelength band, an illumination scheme, and filtering parameters can be selected for an optical system.

REFERENCES:
patent: 4595289 (1986-06-01), Feldman et al.
patent: 5506676 (1996-04-01), Hendler et al.
patent: 6404498 (2002-06-01), Maeda et al.
patent: 6570650 (2003-05-01), Guan et al.
patent: 6777676 (2004-08-01), Wang et al.
patent: 6787773 (2004-09-01), Lee
patent: 6867862 (2005-03-01), Nikoonahad
patent: 7239389 (2007-07-01), Baer et al.
patent: 7369233 (2008-05-01), Nikoonahad et al.
patent: 2007/0081151 (2007-04-01), Shortt et al.
patent: 08-162511 (1996-06-01), None
patent: 2004-087820 (2004-03-01), None

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