Apparatus and method for opens and shorts testing of a circuit b

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

324537, 324679, 324705, 324718, G01R 3102

Patent

active

054324602

ABSTRACT:
A method and apparatus for testing circuit boards uses a pair of probes to contact the various nodes on the circuit board. A single one of the pair of probes may be used to deposit a charge at a being tested net and checking for the presence of a charge at subsequent nets to determine whether a short condition exists. Moreover, the pair of probes is used to contact two nodes of a network being tested to measure the resistance within the network being tested; the measured resistance being compared to a nominal resistance, to determine whether an open condition exists. In addition, the pair of probes may be used to measure the resistance between networks in order to verify or determine whether a short condition exists between networks.

REFERENCES:
patent: 4565966 (1986-01-01), Burr et al.
patent: 5006808 (1991-04-01), Watts
patent: 5122753 (1992-06-01), Myers et al.
patent: 5138266 (1992-08-01), Stearns
patent: 5192913 (1993-03-01), Goruganthu
patent: 5256975 (1993-10-01), Mellitz et al.
patent: 5266901 (1993-11-01), Woo

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