Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1985-07-10
1987-04-14
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, G01B 1124
Patent
active
046573941
ABSTRACT:
Phase measurements of deformed grating images are used in performing improved optical profilometry. Individual line profiles are obtained at a series of rotational increments of a body. A full 360 degree surface profile, or a portion thereof, can then be generated.
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Cline et al., Applied Optics, vol. 21, No. 24, Dec. 15, 1982, pp. 4481-4488.
Evans F. L.
New York Institute of Technology
Novack Martin
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