Apparatus and method for normal incidence reflectance spectrosco

Details Apparatus and method for normal incidence reflectance spectrosco Apparatus and method for normal incidence reflectance spectrosco

1990-03-02

1991-05-14

Rosenberger, Richard A.

Optics: measuring and testing

Of light reflection

350527, G01N 2155

Patent

active

050151002

ABSTRACT:
An external reflectance spectroscopy apparatus and method are disclosed in which maximum radiation througput is obtained by using a beamsplitter which reflects half of a collimated beam and transmits the other half. In order to obtain reliable results, the condition of perpendicular incidence on the sample is approximated (without limiting throughput) by providing a beamsplitter having an uneven number of reflecting blades and the same number of transmitting openings. Each reflecting blade is opposite to an open area having the same size and shape. The result is a substantial equalizing of contributions from rays polarized parallel to the plane of incidence and from rays polarized perpendicular to the plane of incidence.

REFERENCES:
patent: 4479700 (1984-10-01), Abe
patent: 4712912 (1987-12-01), Messerschmidt
patent: 4758088 (1988-07-01), Doyle
patent: 4852955 (1989-08-01), Doyle et al.

Affiliated with

Also associated with

Rating

Apparatus and method for normal incidence reflectance spectrosco does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for normal incidence reflectance spectrosco, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for normal incidence reflectance spectrosco will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1644168