Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-09-13
1993-03-23
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
73104, 340680, G01R 2726
Patent
active
051968002
ABSTRACT:
Non-contact measurement of the sharpness of the cutting edge of a slitting or chopping knife is made repeatably placing a capacitance sensor probe symmetrically over the cutting edge at a predetermined distance (nominal offset) from the calibrated sharp edge of the knife and measuring the capacitance to derive a measurement that varies with knife wear (increasing knife edge radius). A novel sensor holder allowing for repeatable precision placement of the sensor.
REFERENCES:
patent: 2472994 (1949-06-01), Vars
patent: 3641431 (1972-02-01), Pigage et al.
patent: 4620281 (1986-10-01), Thompson et al.
patent: 4885530 (1989-12-01), Mayer et al.
patent: 4958129 (1990-09-01), Poduje et al.
patent: 5101165 (1992-03-01), Rickards
Graff Ernest A.
Podhorecki Mathew J.
Boos, Jr. Francis H.
Eastman Kodak Company
Harvey Jack B.
Regan Maura K.
LandOfFree
Apparatus and method for non-contact measurement of the edge sha does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for non-contact measurement of the edge sha, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for non-contact measurement of the edge sha will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1354973